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Performance Evaluation of GaAs-GaP Core-Shell-Nanowire Field-Effect Transistors.

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Title: Performance Evaluation of GaAs-GaP Core-Shell-Nanowire Field-Effect Transistors.
Authors: He, Yuhui, Zhao, Yuning, Fan, Chun
Source: IEEE Transactions on Electron Devices; June 2009, Vol. 56 Issue 6, p1199-1203, 5p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501441294
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Performance Evaluation of GaAs-GaP Core-Shell-Nanowire Field-Effect Transistors.
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  Data: <searchLink fieldCode="AU" term="%22He%2C+Yuhui%22">He, Yuhui</searchLink><br /><searchLink fieldCode="AU" term="%22Zhao%2C+Yuning%22">Zhao, Yuning</searchLink><br /><searchLink fieldCode="AU" term="%22Fan%2C+Chun%22">Fan, Chun</searchLink>
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TED.2009.2019739
    Languages:
      – Code: eng
        Text: English
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        PageCount: 5
        StartPage: 1199
    Titles:
      – TitleFull: Performance Evaluation of GaAs-GaP Core-Shell-Nanowire Field-Effect Transistors.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: He, Yuhui
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          Name:
            NameFull: Zhao, Yuning
      – PersonEntity:
          Name:
            NameFull: Fan, Chun
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            – D: 01
              M: 06
              Text: June 2009
              Type: published
              Y: 2009
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              Value: 00189383
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              Value: 56
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              Value: 6
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            – TitleFull: IEEE Transactions on Electron Devices
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