APA (7th ed.) Citation

Chien, C., Jian, S., & Wang, C. (2007). Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films. Journal of Physics: D Applied Physics, 40(13), 3985. https://doi.org/10.1088/0022-3727/40/13/011

Chicago Style (17th ed.) Citation

Chien, Chi-Hui, Sheng-Rui Jian, and Chung-Ting Wang. "Cross-sectional Transmission Electron Microscopy Observations on the Berkovich Indentation-induced Deformation Microstructures in GaN Thin Films." Journal of Physics: D Applied Physics 40, no. 13 (2007): 3985. https://doi.org/10.1088/0022-3727/40/13/011.

MLA (9th ed.) Citation

Chien, Chi-Hui, et al. "Cross-sectional Transmission Electron Microscopy Observations on the Berkovich Indentation-induced Deformation Microstructures in GaN Thin Films." Journal of Physics: D Applied Physics, vol. 40, no. 13, 2007, p. 3985, https://doi.org/10.1088/0022-3727/40/13/011.