Revisited Pseudo-MOSFET Models for the Characterization of Ultrathin SOI Wafers.

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Bibliographic Details
Title: Revisited Pseudo-MOSFET Models for the Characterization of Ultrathin SOI Wafers.
Authors: Rodriguez, Noel, Cristoloveanu, Sorin, Gamiz, Francisco
Source: IEEE Transactions on Electron Devices; July 2009, Vol. 56 Issue 7, p1507-1515, 9p
Database: Applied Science & Technology Source
Description
ISSN:00189383
DOI:10.1109/TED.2009.2021715