APA (7th ed.) Citation

Feng, Z. C., Sudharsanan, R., & Perkowitz, S. (1988). Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition. Journal of Applied Physics, 64, 6861. https://doi.org/10.1063/1.341977

Chicago Style (17th ed.) Citation

Feng, Z. C., R. Sudharsanan, and S. Perkowitz. "Raman Scattering Characterization of High-quality Cd1-xMnxTe Films Grown by Metalorganic Chemical Vapor Deposition." Journal of Applied Physics 64 (1988): 6861. https://doi.org/10.1063/1.341977.

MLA (9th ed.) Citation

Feng, Z. C., et al. "Raman Scattering Characterization of High-quality Cd1-xMnxTe Films Grown by Metalorganic Chemical Vapor Deposition." Journal of Applied Physics, vol. 64, 1988, p. 6861, https://doi.org/10.1063/1.341977.