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Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.

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Title: Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
Authors: Feng, Z. C., Sudharsanan, R., Perkowitz, S.
Source: Journal of Applied Physics; December 15 1988, Vol. 64, p6861-6863, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501606290
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
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  Data: <searchLink fieldCode="AU" term="%22Feng%2C+Z%2E+C%2E%22">Feng, Z. C.</searchLink><br /><searchLink fieldCode="AU" term="%22Sudharsanan%2C+R%2E%22">Sudharsanan, R.</searchLink><br /><searchLink fieldCode="AU" term="%22Perkowitz%2C+S%2E%22">Perkowitz, S.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; December 15 1988, Vol. 64, p6861-6863, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501606290
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.341977
    Languages:
      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 6861
    Titles:
      – TitleFull: Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
        Type: main
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          Name:
            NameFull: Feng, Z. C.
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            NameFull: Sudharsanan, R.
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            NameFull: Perkowitz, S.
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            – D: 15
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              Text: December 15 1988
              Type: published
              Y: 1988
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              Value: 00218979
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              Value: 64
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            – TitleFull: Journal of Applied Physics
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