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Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.

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Bibliographic Details
Title: Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition.
Authors: Feng, Z. C., Sudharsanan, R., Perkowitz, S.
Source: Journal of Applied Physics; December 15 1988, Vol. 64, p6861-6863, 3p
Database: Applied Science & Technology Source
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