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Logic-Based Pattern Discovery.

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Bibliographic Details
Title: Logic-Based Pattern Discovery.
Authors: Sim, Alex Tze Hiang, Indrawan, Maria, Zutshi, Samar
Source: IEEE Transactions on Knowledge & Data Engineering; June 2010, Vol. 22 Issue 6, p798-811, 14p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501620747
AccessLevel: 2
PubType: Academic Journal
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        Value: 10.1109/TKDE.2010.49
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        Text: English
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        PageCount: 14
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            NameFull: Sim, Alex Tze Hiang
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            NameFull: Indrawan, Maria
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              Text: June 2010
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              Y: 2010
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