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Microstructural Characterization of CdTe SurfacePassivation Layers.

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Bibliographic Details
Title: Microstructural Characterization of CdTe SurfacePassivation Layers.
Authors: Zhao, W. F., Cook, J., Parodos, T.
Source: Journal of Electronic Materials; July 2010, Vol. 39 Issue 7, p924-929, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501630668
AccessLevel: 2
PubType: Academic Journal
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  Data: Microstructural Characterization of CdTe SurfacePassivation Layers.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; July 2010, Vol. 39 Issue 7, p924-929, 6p
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        Value: 10.1007/s11664-010-1176-6
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 924
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      – TitleFull: Microstructural Characterization of CdTe SurfacePassivation Layers.
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            NameFull: Zhao, W. F.
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            NameFull: Cook, J.
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              Text: July 2010
              Type: published
              Y: 2010
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