Trapping in high-k dielectrics.
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| Title: | Trapping in high-k dielectrics. |
|---|---|
| Authors: | Rao, Rosario, Simoncini, Riccardo, Irrera, Fernanda |
| Source: | Applied Physics Letters; October 18 2010, Vol. 97 Issue 16, p163502-1-163502-3, 3p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 501693453 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=501693453 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.3503583 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 3 StartPage: 163502-1 Titles: – TitleFull: Trapping in high-k dielectrics. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Rao, Rosario – PersonEntity: Name: NameFull: Simoncini, Riccardo – PersonEntity: Name: NameFull: Irrera, Fernanda IsPartOfRelationships: – BibEntity: Dates: – D: 18 M: 10 Text: October 18 2010 Type: published Y: 2010 Identifiers: – Type: issn-print Value: 00036951 Numbering: – Type: volume Value: 97 – Type: issue Value: 16 Titles: – TitleFull: Applied Physics Letters Type: main |
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