APA (7th ed.) Citation

El-Deeb, W. S., Hashmi, M. S., & Smida, S. B. (2010). Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices. IET Microwaves, Antennas & Propagation, 4(11), 1773. https://doi.org/10.1049/iet-map.2009.0317

Chicago Style (17th ed.) Citation

El-Deeb, W. S., M. S. Hashmi, and S. B. Smida. "Thru-less Calibration Algorithm and Measurement System for On-wafer Large-signal Characterisation of Microwave Devices." IET Microwaves, Antennas & Propagation 4, no. 11 (2010): 1773. https://doi.org/10.1049/iet-map.2009.0317.

MLA (9th ed.) Citation

El-Deeb, W. S., et al. "Thru-less Calibration Algorithm and Measurement System for On-wafer Large-signal Characterisation of Microwave Devices." IET Microwaves, Antennas & Propagation, vol. 4, no. 11, 2010, p. 1773, https://doi.org/10.1049/iet-map.2009.0317.