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Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.

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Title: Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.
Authors: El-Deeb, W. S., Hashmi, M. S., Smida, S. B.
Source: IET Microwaves, Antennas & Propagation; November 2010, Vol. 4 Issue 11, p1773-1781, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501708095
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PubType: Academic Journal
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        Value: 10.1049/iet-map.2009.0317
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 1773
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      – TitleFull: Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.
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              Text: November 2010
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