Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.

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Bibliographic Details
Title:	Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices.
Authors:	El-Deeb, W. S., Hashmi, M. S., Smida, S. B.
Source:	IET Microwaves, Antennas & Propagation; November 2010, Vol. 4 Issue 11, p1773-1781, 9p
Database:	Applied Science & Technology Source

Description
ISSN:	17518725
DOI:	10.1049/iet-map.2009.0317