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Laser-induced damage to silicon charge-coupled imaging devices.

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Bibliographic Details
Title: Laser-induced damage to silicon charge-coupled imaging devices.
Authors: Zhang, Chenzhi, Watkins, Steve E., Walser, Rodger M.
Source: Optical Engineering; May 1991, Vol. 30, p651-657, 7p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 501869258
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Laser-induced damage to silicon charge-coupled imaging devices.
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 651
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      – TitleFull: Laser-induced damage to silicon charge-coupled imaging devices.
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          Name:
            NameFull: Zhang, Chenzhi
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            NameFull: Watkins, Steve E.
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            NameFull: Walser, Rodger M.
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            – D: 01
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              Text: May 1991
              Type: published
              Y: 1991
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              Value: 00913286
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              Value: 30
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