Inelastic electron tunneling spectroscopy of amorphous SiOx barriers.

Saved in:
Bibliographic Details
Title: Inelastic electron tunneling spectroscopy of amorphous SiOx barriers.
Authors: Mallik, R. R., Kulnis, W. J. Jr, Butler, T. Jr
Source: Journal of Applied Physics; October 1 1991, Vol. 70, p3703-3706, 4p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.349220