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High-fidelity test panel.

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Bibliographic Details
Title: High-fidelity test panel.
Authors: Burstein, H., Graham, C. B.
Source: Radio-Electronics; July 1960, Vol. 31, p68-74, 7p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 515845553
AccessLevel: 2
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
IllustrationInfo
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  Data: <searchLink fieldCode="AU" term="%22Burstein%2C+H%2E%22">Burstein, H.</searchLink><br /><searchLink fieldCode="AU" term="%22Graham%2C+C%2E+B%2E%22">Graham, C. B.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Radio-Electronics%22">Radio-Electronics</searchLink>; July 1960, Vol. 31, p68-74, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=515845553
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 68
    Titles:
      – TitleFull: High-fidelity test panel.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Burstein, H.
      – PersonEntity:
          Name:
            NameFull: Graham, C. B.
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      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: July 1960
              Type: published
              Y: 1960
          Identifiers:
            – Type: issn-print
              Value: 00337862
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            – Type: volume
              Value: 31
          Titles:
            – TitleFull: Radio-Electronics
              Type: main
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