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Plasma reflection edge in thin films of semiconductors.

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Bibliographic Details
Title: Plasma reflection edge in thin films of semiconductors.
Authors: Howson, R. P.
Source: Journal of Physics: D Applied Physics; June 1970, Vol. 3, p863-870, 8p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 516381528
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Plasma reflection edge in thin films of semiconductors.
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1088/0022-3727/3/6/305
    Languages:
      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 863
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      – TitleFull: Plasma reflection edge in thin films of semiconductors.
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            NameFull: Howson, R. P.
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          Dates:
            – D: 02
              M: 06
              Text: June 1970
              Type: published
              Y: 1970
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              Value: 00223727
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              Value: 3
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            – TitleFull: Journal of Physics: D Applied Physics
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