Lower critical field measurements in NbN bulk and thin films.
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| Title: | Lower critical field measurements in NbN bulk and thin films. |
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| Authors: | Mathur, M. P. |
| Source: | Journal of Applied Physics; July 1972, Vol. 43, p3158-3161, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1661678 |
