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Lower critical field measurements in NbN bulk and thin films.

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Bibliographic Details
Title: Lower critical field measurements in NbN bulk and thin films.
Authors: Mathur, M. P.
Source: Journal of Applied Physics; July 1972, Vol. 43, p3158-3161, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 516568811
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Lower critical field measurements in NbN bulk and thin films.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.1661678
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 4
        StartPage: 3158
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      – TitleFull: Lower critical field measurements in NbN bulk and thin films.
        Type: main
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            NameFull: Mathur, M. P.
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          Dates:
            – D: 02
              M: 07
              Text: July 1972
              Type: published
              Y: 1972
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              Value: 43
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            – TitleFull: Journal of Applied Physics
              Type: main
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