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Effects of the microelectronics revolution on systems and board test.

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Bibliographic Details
Title: Effects of the microelectronics revolution on systems and board test.
Authors: Foley, E.
Source: Computer; October 1979, Vol. 12, p32-38, 7p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 517236389
AccessLevel: 2
PubType: Academic Journal
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/MC.1979.1658494
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 7
        StartPage: 32
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      – TitleFull: Effects of the microelectronics revolution on systems and board test.
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            NameFull: Foley, E.
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          Dates:
            – D: 01
              M: 10
              Text: October 1979
              Type: published
              Y: 1979
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              Value: 00189162
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              Value: 12
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            – TitleFull: Computer
              Type: main
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