APA (7th ed.) Citation

Tam, W. C., Poku, O., & Blanton, R. D. (2009). Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods. DAC: Annual ACM/IEEE Design Automation Conference, 708.

Chicago Style (17th ed.) Citation

Tam, Wing Chiu, Osei Poku, and R. D. Blanton. "Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods." DAC: Annual ACM/IEEE Design Automation Conference 2009: 708.

MLA (9th ed.) Citation

Tam, Wing Chiu, et al. "Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods." DAC: Annual ACM/IEEE Design Automation Conference, 2009, p. 708.