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Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods.

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Title: Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods.
Authors: Wing Chiu Tam1, wtam@ece.cmu.edu, Osei Poku1, opoku@ece.cmu.edu, Blanton, R. D. (Shawn)1, blanton@ece.cmu.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jul2009, p708-713, 6p, 5 Diagrams, 4 Charts
Database: Applied Science & Technology Source
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PubType: Conference
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  Data: <searchLink fieldCode="AU" term="%22Wing+Chiu+Tam%22">Wing Chiu Tam</searchLink><relatesTo>1</relatesTo>, <i>wtam@ece.cmu.edu</i><br /><searchLink fieldCode="AU" term="%22Osei+Poku%22">Osei Poku</searchLink><relatesTo>1</relatesTo>, <i>opoku@ece.cmu.edu</i><br /><searchLink fieldCode="AU" term="%22Blanton%2C+R%2E+D%2E+%28Shawn%29%22">Blanton, R. D. (Shawn)</searchLink><relatesTo>1</relatesTo>, <i>blanton@ece.cmu.edu</i>
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 708
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      – TitleFull: Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods.
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            NameFull: Wing Chiu Tam
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            NameFull: Osei Poku
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            NameFull: Blanton, R. D. (Shawn)
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            – D: 01
              M: 07
              Text: Jul2009
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              Y: 2009
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