Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods.
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| Title: | Automated Failure Population Creation for Validating Integrated Circuit Diagnosis Methods. |
|---|---|
| Authors: | Wing Chiu Tam1, wtam@ece.cmu.edu, Osei Poku1, opoku@ece.cmu.edu, Blanton, R. D. (Shawn)1, blanton@ece.cmu.edu |
| Source: | DAC: Annual ACM/IEEE Design Automation Conference; Jul2009, p708-713, 6p, 5 Diagrams, 4 Charts |
| Database: | Applied Science & Technology Source |
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