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Improved Resistive Switching of Textured ZnO Thin Films Grown on Ru Electrodes.

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Title: Improved Resistive Switching of Textured ZnO Thin Films Grown on Ru Electrodes.
Authors: Liu, Zi-Jheng, Chou, Jen-Chun, Wei, Shih-Yuan, Gan, Jon-Yiew, Yew, Tri-Rung
Source: IEEE Electron Device Letters; December 2011, Vol. 32 Issue 12, p1728-1730, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 527646124
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Improved Resistive Switching of Textured ZnO Thin Films Grown on Ru Electrodes.
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  Data: <searchLink fieldCode="AU" term="%22Liu%2C+Zi-Jheng%22">Liu, Zi-Jheng</searchLink><br /><searchLink fieldCode="AU" term="%22Chou%2C+Jen-Chun%22">Chou, Jen-Chun</searchLink><br /><searchLink fieldCode="AU" term="%22Wei%2C+Shih-Yuan%22">Wei, Shih-Yuan</searchLink><br /><searchLink fieldCode="AU" term="%22Gan%2C+Jon-Yiew%22">Gan, Jon-Yiew</searchLink><br /><searchLink fieldCode="AU" term="%22Yew%2C+Tri-Rung%22">Yew, Tri-Rung</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; December 2011, Vol. 32 Issue 12, p1728-1730, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=527646124
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/LED.2011.2167710
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 1728
    Titles:
      – TitleFull: Improved Resistive Switching of Textured ZnO Thin Films Grown on Ru Electrodes.
        Type: main
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          Name:
            NameFull: Liu, Zi-Jheng
      – PersonEntity:
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            NameFull: Chou, Jen-Chun
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            NameFull: Wei, Shih-Yuan
      – PersonEntity:
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            NameFull: Gan, Jon-Yiew
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            NameFull: Yew, Tri-Rung
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              Text: December 2011
              Type: published
              Y: 2011
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              Value: 07413106
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              Value: 32
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              Value: 12
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            – TitleFull: IEEE Electron Device Letters
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