APA (7th ed.) Citation

Smulko, J., Józwiak, K., Olesz, M., & Hasse, L. (2011). Acoustic emission for detecting deterioration of capacitors under aging. Microelectronics Reliability, 51(3), 621. https://doi.org/10.1016/j.microrel.2010.10.013

Chicago Style (17th ed.) Citation

Smulko, Janusz, Kazimierz Józwiak, Marek Olesz, and Lech Hasse. "Acoustic Emission for Detecting Deterioration of Capacitors Under Aging." Microelectronics Reliability 51, no. 3 (2011): 621. https://doi.org/10.1016/j.microrel.2010.10.013.

MLA (9th ed.) Citation

Smulko, Janusz, et al. "Acoustic Emission for Detecting Deterioration of Capacitors Under Aging." Microelectronics Reliability, vol. 51, no. 3, 2011, p. 621, https://doi.org/10.1016/j.microrel.2010.10.013.