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Acoustic emission for detecting deterioration of capacitors under aging

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Bibliographic Details
Title: Acoustic emission for detecting deterioration of capacitors under aging
Authors: Smulko, Janusz1, jsmulko@eti.pg.gda.pl, Józwiak, Kazimierz2, Olesz, Marek3, Hasse, Lech1
Source: Microelectronics Reliability; Mar2011, Vol. 51 Issue 3, p621-627, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 58542723
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Acoustic emission for detecting deterioration of capacitors under aging
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  Data: <searchLink fieldCode="AU" term="%22Smulko%2C+Janusz%22">Smulko, Janusz</searchLink><relatesTo>1</relatesTo>, <i>jsmulko@eti.pg.gda.pl</i><br /><searchLink fieldCode="AU" term="%22Józwiak%2C+Kazimierz%22">Józwiak, Kazimierz</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Olesz%2C+Marek%22">Olesz, Marek</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Hasse%2C+Lech%22">Hasse, Lech</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>; Mar2011, Vol. 51 Issue 3, p621-627, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=58542723
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.microrel.2010.10.013
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 621
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      – TitleFull: Acoustic emission for detecting deterioration of capacitors under aging
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            NameFull: Smulko, Janusz
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            NameFull: Józwiak, Kazimierz
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            NameFull: Olesz, Marek
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              Text: Mar2011
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            – TitleFull: Microelectronics Reliability
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