APA (7th ed.) Citation

Bettge, M., MacLaren, S., Burdin, S., Abraham, D., Petrov, I., Yu, M., & Sammann, E. (2011). Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires. Journal of Materials Research, 26(17), 2247. https://doi.org/10.1557/jmr.2011.151

Chicago Style (17th ed.) Citation

Bettge, Martin, Scott MacLaren, Steve Burdin, Daniel Abraham, Ivan Petrov, Min-Feng Yu, and Ernie Sammann. "Importance of Line and Interfacial Energies During VLS Growth of Finely Stranded Silica Nanowires." Journal of Materials Research 26, no. 17 (2011): 2247. https://doi.org/10.1557/jmr.2011.151.

MLA (9th ed.) Citation

Bettge, Martin, et al. "Importance of Line and Interfacial Energies During VLS Growth of Finely Stranded Silica Nanowires." Journal of Materials Research, vol. 26, no. 17, 2011, p. 2247, https://doi.org/10.1557/jmr.2011.151.