Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires.
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| Title: | Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires. |
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| Authors: | Bettge, Martin1,2, bettge@mrl.uiuc.edu, MacLaren, Scott2, Burdin, Steve2, Abraham, Daniel3, Petrov, Ivan2, Min-Feng Yu1, Sammann, Ernie2 |
| Source: | Journal of Materials Research; 9/14/2011, Vol. 26 Issue 17, p2247-2253, 7p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 67713188 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Bettge%2C+Martin%22">Bettge, Martin</searchLink><relatesTo>1,2</relatesTo>, <i>bettge@mrl.uiuc.edu</i><br /><searchLink fieldCode="AU" term="%22MacLaren%2C+Scott%22">MacLaren, Scott</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Burdin%2C+Steve%22">Burdin, Steve</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Abraham%2C+Daniel%22">Abraham, Daniel</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Petrov%2C+Ivan%22">Petrov, Ivan</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Min-Feng+Yu%22">Min-Feng Yu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sammann%2C+Ernie%22">Sammann, Ernie</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Research%22">Journal of Materials Research</searchLink>; 9/14/2011, Vol. 26 Issue 17, p2247-2253, 7p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=67713188 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1557/jmr.2011.151 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 2247 Titles: – TitleFull: Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Bettge, Martin – PersonEntity: Name: NameFull: MacLaren, Scott – PersonEntity: Name: NameFull: Burdin, Steve – PersonEntity: Name: NameFull: Abraham, Daniel – PersonEntity: Name: NameFull: Petrov, Ivan – PersonEntity: Name: NameFull: Min-Feng Yu – PersonEntity: Name: NameFull: Sammann, Ernie IsPartOfRelationships: – BibEntity: Dates: – D: 14 M: 09 Text: 9/14/2011 Type: published Y: 2011 Identifiers: – Type: issn-print Value: 08842914 Numbering: – Type: volume Value: 26 – Type: issue Value: 17 Titles: – TitleFull: Journal of Materials Research Type: main |
| ResultId | 1 |