Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires.

Saved in:
Bibliographic Details
Title: Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires.
Authors: Bettge, Martin1,2, bettge@mrl.uiuc.edu, MacLaren, Scott2, Burdin, Steve2, Abraham, Daniel3, Petrov, Ivan2, Min-Feng Yu1, Sammann, Ernie2
Source: Journal of Materials Research; 9/14/2011, Vol. 26 Issue 17, p2247-2253, 7p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 67713188
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Bettge%2C+Martin%22">Bettge, Martin</searchLink><relatesTo>1,2</relatesTo>, <i>bettge@mrl.uiuc.edu</i><br /><searchLink fieldCode="AU" term="%22MacLaren%2C+Scott%22">MacLaren, Scott</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Burdin%2C+Steve%22">Burdin, Steve</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Abraham%2C+Daniel%22">Abraham, Daniel</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Petrov%2C+Ivan%22">Petrov, Ivan</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Min-Feng+Yu%22">Min-Feng Yu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sammann%2C+Ernie%22">Sammann, Ernie</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Research%22">Journal of Materials Research</searchLink>; 9/14/2011, Vol. 26 Issue 17, p2247-2253, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=67713188
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1557/jmr.2011.151
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 2247
    Titles:
      – TitleFull: Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Bettge, Martin
      – PersonEntity:
          Name:
            NameFull: MacLaren, Scott
      – PersonEntity:
          Name:
            NameFull: Burdin, Steve
      – PersonEntity:
          Name:
            NameFull: Abraham, Daniel
      – PersonEntity:
          Name:
            NameFull: Petrov, Ivan
      – PersonEntity:
          Name:
            NameFull: Min-Feng Yu
      – PersonEntity:
          Name:
            NameFull: Sammann, Ernie
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 14
              M: 09
              Text: 9/14/2011
              Type: published
              Y: 2011
          Identifiers:
            – Type: issn-print
              Value: 08842914
          Numbering:
            – Type: volume
              Value: 26
            – Type: issue
              Value: 17
          Titles:
            – TitleFull: Journal of Materials Research
              Type: main
ResultId 1