Sebbag, Y., Goykhman, I., Desiatov, B., Nachmias, T., Yoshaei, O., Kabla, M., . . . Levy, U. (2012). Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film. Applied Physics Letters, 100(14), 141107. https://doi.org/10.1063/1.3701587
Chicago Style (17th ed.) CitationSebbag, Y., I. Goykhman, B. Desiatov, T. Nachmias, O. Yoshaei, M. Kabla, S. E. Meltzer, and U. Levy. "Bistability in Silicon Microring Resonator Based on Strain Induced by a Piezoelectric Lead Zirconate Titanate Thin Film." Applied Physics Letters 100, no. 14 (2012): 141107. https://doi.org/10.1063/1.3701587.
MLA (9th ed.) CitationSebbag, Y., et al. "Bistability in Silicon Microring Resonator Based on Strain Induced by a Piezoelectric Lead Zirconate Titanate Thin Film." Applied Physics Letters, vol. 100, no. 14, 2012, p. 141107, https://doi.org/10.1063/1.3701587.