Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film.

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Title: Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film.
Authors: Sebbag, Y.1, Goykhman, I.1, Desiatov, B.1, Nachmias, T.2, Yoshaei, O.2, Kabla, M.2, Meltzer, S. E.2, Levy, U.1
Source: Applied Physics Letters; 4/2/2012, Vol. 100 Issue 14, p141107, 4p, 1 Color Photograph, 4 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 74088687
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 4/2/2012, Vol. 100 Issue 14, p141107, 4p, 1 Color Photograph, 4 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=74088687
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        Value: 10.1063/1.3701587
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      – Code: eng
        Text: English
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      – TitleFull: Bistability in silicon microring resonator based on strain induced by a piezoelectric lead zirconate titanate thin film.
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            NameFull: Sebbag, Y.
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            NameFull: Goykhman, I.
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            NameFull: Desiatov, B.
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            NameFull: Nachmias, T.
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            NameFull: Yoshaei, O.
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            NameFull: Kabla, M.
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              Text: 4/2/2012
              Type: published
              Y: 2012
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            – TitleFull: Applied Physics Letters
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