Wilson, L. A., Rossall, A. K., Wagenaars, E., Cacho, C. M., Springate, E., Turcu, I. C. E., & Tallents, G. J. (2012). Double slit interferometry to measure the EUV refractive indices of solids using high harmonics. Applied Optics (1559-128X), 51(12), 2057. https://doi.org/10.1364/ao.51.002057
Chicago Style (17th ed.) CitationWilson, Lucy A., Andrew K. Rossall, Erik Wagenaars, Cephise M. Cacho, Emma Springate, I. C. Edmond Turcu, and Greg J. Tallents. "Double Slit Interferometry to Measure the EUV Refractive Indices of Solids Using High Harmonics." Applied Optics (1559-128X) 51, no. 12 (2012): 2057. https://doi.org/10.1364/ao.51.002057.
MLA (9th ed.) CitationWilson, Lucy A., et al. "Double Slit Interferometry to Measure the EUV Refractive Indices of Solids Using High Harmonics." Applied Optics (1559-128X), vol. 51, no. 12, 2012, p. 2057, https://doi.org/10.1364/ao.51.002057.