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Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits.

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Title: Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits.
Authors: Chin-Cheng Kuo1, cckuoz@tsmc.com, Wei-Yi Hu1,2, wyhu@tsmc.com, Yi-Hung Chen1, simon•chen@tsmc.com, Jui-Feng Kuan1, jfkuan@tsmc.com, Yi-Kan Cheng1, yk•cheng@tsmc.com
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2012, p1113-1118, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 76581466
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PubType: Conference
PubTypeId: conference
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  Data: Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits.
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  Data: <searchLink fieldCode="AU" term="%22Chin-Cheng+Kuo%22">Chin-Cheng Kuo</searchLink><relatesTo>1</relatesTo>, <i>cckuoz@tsmc.com</i><br /><searchLink fieldCode="AU" term="%22Wei-Yi+Hu%22">Wei-Yi Hu</searchLink><relatesTo>1,2</relatesTo>, <i>wyhu@tsmc.com</i><br /><searchLink fieldCode="AU" term="%22Yi-Hung+Chen%22">Yi-Hung Chen</searchLink><relatesTo>1</relatesTo>, <i>simon•chen@tsmc.com</i><br /><searchLink fieldCode="AU" term="%22Jui-Feng+Kuan%22">Jui-Feng Kuan</searchLink><relatesTo>1</relatesTo>, <i>jfkuan@tsmc.com</i><br /><searchLink fieldCode="AU" term="%22Yi-Kan+Cheng%22">Yi-Kan Cheng</searchLink><relatesTo>1</relatesTo>, <i>yk•cheng@tsmc.com</i>
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  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; Jun2012, p1113-1118, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=76581466
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 1113
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      – TitleFull: Efficient Trimmed-sample Monte Carlo Methodology and Yield-aware Design Flow for Analog Circuits.
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            NameFull: Chin-Cheng Kuo
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            NameFull: Wei-Yi Hu
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            NameFull: Yi-Hung Chen
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            NameFull: Jui-Feng Kuan
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            NameFull: Yi-Kan Cheng
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            – D: 01
              M: 06
              Text: Jun2012
              Type: published
              Y: 2012
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            – Type: issn-print
              Value: 0738100X
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            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
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