PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability Analysis Method.

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Title: PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability Analysis Method.
Authors: Wujie Wen1, wuw2@pitt.edu, Yaojun Zhang1, yaz24@pitt.edu, Yiran Chen1, yic52@pitt.edu, Yu Wang2, yu-wang@mail.tsinghua.edu.cn, Yuan Xie3, yuanxie@cse.psu.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2012, p1191-1196, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 76581479
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability Analysis Method.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Wujie+Wen%22">Wujie Wen</searchLink><relatesTo>1</relatesTo>, <i>wuw2@pitt.edu</i><br /><searchLink fieldCode="AU" term="%22Yaojun+Zhang%22">Yaojun Zhang</searchLink><relatesTo>1</relatesTo>, <i>yaz24@pitt.edu</i><br /><searchLink fieldCode="AU" term="%22Yiran+Chen%22">Yiran Chen</searchLink><relatesTo>1</relatesTo>, <i>yic52@pitt.edu</i><br /><searchLink fieldCode="AU" term="%22Yu+Wang%22">Yu Wang</searchLink><relatesTo>2</relatesTo>, <i>yu-wang@mail.tsinghua.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Yuan+Xie%22">Yuan Xie</searchLink><relatesTo>3</relatesTo>, <i>yuanxie@cse.psu.edu</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22DAC%3A+Annual+ACM%2FIEEE+Design+Automation+Conference%22">DAC: Annual ACM/IEEE Design Automation Conference</searchLink>; Jun2012, p1191-1196, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=76581479
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1191
    Titles:
      – TitleFull: PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability Analysis Method.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wujie Wen
      – PersonEntity:
          Name:
            NameFull: Yaojun Zhang
      – PersonEntity:
          Name:
            NameFull: Yiran Chen
      – PersonEntity:
          Name:
            NameFull: Yu Wang
      – PersonEntity:
          Name:
            NameFull: Yuan Xie
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2012
              Type: published
              Y: 2012
          Identifiers:
            – Type: issn-print
              Value: 0738100X
          Titles:
            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
              Type: main
ResultId 1