APA (7th ed.) Citation

Kong, J., & Chung, S. W. (2012). Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors. DAC: Annual ACM/IEEE Design Automation Conference, 1197.

Chicago Style (17th ed.) Citation

Kong, Joonho, and Sung Woo Chung. "Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors." DAC: Annual ACM/IEEE Design Automation Conference 2012: 1197.

MLA (9th ed.) Citation

Kong, Joonho, and Sung Woo Chung. "Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors." DAC: Annual ACM/IEEE Design Automation Conference, 2012, p. 1197.