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Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors.

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Bibliographic Details
Title: Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors.
Authors: Joonho Kong1, luisfigo77@korea.ac.kr, Sung Woo Chung1, swchung@korea.ac.kr
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2012, p1197-1206, 10p
Database: Applied Science & Technology Source
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PubType: Conference
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        Text: English
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      – TitleFull: Exploiting Narrow-Width Values for Process Variation- Tolerant 3-D Microprocessors.
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              Text: Jun2012
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              Y: 2012
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