Maheswari, B., & Dhanam, M. (2013). Influence of vacuum annealing on the properties of SILAR CuInS thin films and optimization of annealing duration. Journal of Materials Science: Materials in Electronics, 24(9), 3481. https://doi.org/10.1007/s10854-013-1273-4
Chicago Style (17th ed.) CitationMaheswari, B., and M. Dhanam. "Influence of Vacuum Annealing on the Properties of SILAR CuInS Thin Films and Optimization of Annealing Duration." Journal of Materials Science: Materials in Electronics 24, no. 9 (2013): 3481. https://doi.org/10.1007/s10854-013-1273-4.
MLA (9th ed.) CitationMaheswari, B., and M. Dhanam. "Influence of Vacuum Annealing on the Properties of SILAR CuInS Thin Films and Optimization of Annealing Duration." Journal of Materials Science: Materials in Electronics, vol. 24, no. 9, 2013, p. 3481, https://doi.org/10.1007/s10854-013-1273-4.