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High temperature reverse bias reliability testing of high power devices.

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Bibliographic Details
Title: High temperature reverse bias reliability testing of high power devices.
Authors: WENG, LISHAN, Lishan.Weng@keithley.com
Source: Solid State Technology; Sep2013, Vol. 56 Issue 6, p21-24, 4p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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        Text: English
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              M: 09
              Text: Sep2013
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