APA (7th ed.) Citation

Das, A., Ege, B., Ghosh, S., Batina, L., & Verbauwhede, I. (2013). Security Analysis of Industrial Test Compression Schemes. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 32(12), 1966. https://doi.org/10.1109/TCAD.2013.2274619

Chicago Style (17th ed.) Citation

Das, Amitabh, Baris Ege, Santosh Ghosh, Lejla Batina, and Ingrid Verbauwhede. "Security Analysis of Industrial Test Compression Schemes." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 32, no. 12 (2013): 1966. https://doi.org/10.1109/TCAD.2013.2274619.

MLA (9th ed.) Citation

Das, Amitabh, et al. "Security Analysis of Industrial Test Compression Schemes." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 32, no. 12, 2013, p. 1966, https://doi.org/10.1109/TCAD.2013.2274619.