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Security Analysis of Industrial Test Compression Schemes.

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Bibliographic Details
Title: Security Analysis of Industrial Test Compression Schemes.
Authors: Das, Amitabh1, Ege, Baris2, Ghosh, Santosh3, Batina, Lejla2, Verbauwhede, Ingrid1
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Dec2013, Vol. 32 Issue 12, p1966-1977, 12p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 92520614
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Security Analysis of Industrial Test Compression Schemes.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Das%2C+Amitabh%22">Das, Amitabh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Ege%2C+Baris%22">Ege, Baris</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Ghosh%2C+Santosh%22">Ghosh, Santosh</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Batina%2C+Lejla%22">Batina, Lejla</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Verbauwhede%2C+Ingrid%22">Verbauwhede, Ingrid</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Computer-Aided+Design+of+Integrated+Circuits+%26+Systems%22">IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems</searchLink>; Dec2013, Vol. 32 Issue 12, p1966-1977, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=92520614
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TCAD.2013.2274619
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 1966
    Titles:
      – TitleFull: Security Analysis of Industrial Test Compression Schemes.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Das, Amitabh
      – PersonEntity:
          Name:
            NameFull: Ege, Baris
      – PersonEntity:
          Name:
            NameFull: Ghosh, Santosh
      – PersonEntity:
          Name:
            NameFull: Batina, Lejla
      – PersonEntity:
          Name:
            NameFull: Verbauwhede, Ingrid
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2013
              Type: published
              Y: 2013
          Identifiers:
            – Type: issn-print
              Value: 02780070
          Numbering:
            – Type: volume
              Value: 32
            – Type: issue
              Value: 12
          Titles:
            – TitleFull: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
              Type: main
ResultId 1