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Security Analysis of Industrial Test Compression Schemes.

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Bibliographic Details
Title:	Security Analysis of Industrial Test Compression Schemes.
Authors:	Das, Amitabh¹, Ege, Baris², Ghosh, Santosh³, Batina, Lejla², Verbauwhede, Ingrid¹
Source:	IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Dec2013, Vol. 32 Issue 12, p1966-1977, 12p
Database:	Applied Science & Technology Source

Description
ISSN:	02780070
DOI:	10.1109/TCAD.2013.2274619