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Barrierless Cu–Ni–Nb thin films on silicon with high thermal stability and low electrical resistivity.

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Title: Barrierless Cu–Ni–Nb thin films on silicon with high thermal stability and low electrical resistivity.
Authors: Li, Xiao Na1, Zhao, Li Rong1, Li, Zhen2, Liu, Li Jun1, Bao, Cui Min3, Chu, Jinn P.4, Dong, Chuang1
Source: Journal of Materials Research; Dec2013, Vol. 28 Issue 24, p3367-3373, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 93308037
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Barrierless Cu–Ni–Nb thin films on silicon with high thermal stability and low electrical resistivity.
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  Data: <searchLink fieldCode="AU" term="%22Li%2C+Xiao+Na%22">Li, Xiao Na</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhao%2C+Li+Rong%22">Zhao, Li Rong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Zhen%22">Li, Zhen</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Li+Jun%22">Liu, Li Jun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Bao%2C+Cui+Min%22">Bao, Cui Min</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Chu%2C+Jinn+P%2E%22">Chu, Jinn P.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Dong%2C+Chuang%22">Dong, Chuang</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Research%22">Journal of Materials Research</searchLink>; Dec2013, Vol. 28 Issue 24, p3367-3373, 7p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=93308037
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1557/jmr.2013.355
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 3367
    Titles:
      – TitleFull: Barrierless Cu–Ni–Nb thin films on silicon with high thermal stability and low electrical resistivity.
        Type: main
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            NameFull: Li, Xiao Na
      – PersonEntity:
          Name:
            NameFull: Zhao, Li Rong
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            NameFull: Li, Zhen
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            NameFull: Liu, Li Jun
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            NameFull: Bao, Cui Min
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            NameFull: Chu, Jinn P.
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            NameFull: Dong, Chuang
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          Dates:
            – D: 28
              M: 12
              Text: Dec2013
              Type: published
              Y: 2013
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              Value: 08842914
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              Value: 28
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              Value: 24
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            – TitleFull: Journal of Materials Research
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