The behavior of off-state stress-induced electrons trapped at the buffer layer in AlGaN/GaN heterostructure field effect transistors.
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| Title: | The behavior of off-state stress-induced electrons trapped at the buffer layer in AlGaN/GaN heterostructure field effect transistors. |
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| Authors: | Liao, W. C.1, Chen, Y. L.1, Chen, C. H.1, Chyi, J. I.1, Hsin, Y. M.1 |
| Source: | Applied Physics Letters; 1/20/2014, Vol. 104 Issue 3, p033503-1-033503-5, 5p, 5 Graphs |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.4862669 |
