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On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors.

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Title: On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors.
Authors: Sabena, Davide1, Reorda, Matteo Sonza1, Sterpone, Luca1
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Apr2014, Vol. 22 Issue 4, p813-823, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 95054744
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TVLSI.2013.2252636
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 813
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      – TitleFull: On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors.
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            NameFull: Sabena, Davide
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            NameFull: Reorda, Matteo Sonza
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            NameFull: Sterpone, Luca
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              Text: Apr2014
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              Y: 2014
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            – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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