A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.

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Bibliographic Details
Title: A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.
Authors: Dongkwan Han1, eastsee@soc.yonsei.ac.kr, Yong Lee1, daiginda@soc.yonsei.ac.kr, Sungho Kang1, shkang@yonsei.ac.kr
Source: ETRI Journal; Apr2014, Vol. 36 Issue 2, p293-300, 8p
Database: Applied Science & Technology Source
Description
ISSN:12256463
DOI:10.4218/etrij.14.0113.0469