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A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.

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Title: A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.
Authors: Dongkwan Han1, eastsee@soc.yonsei.ac.kr, Yong Lee1, daiginda@soc.yonsei.ac.kr, Sungho Kang1, shkang@yonsei.ac.kr
Source: ETRI Journal; Apr2014, Vol. 36 Issue 2, p293-300, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 95498058
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.
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  Data: <searchLink fieldCode="AU" term="%22Dongkwan+Han%22">Dongkwan Han</searchLink><relatesTo>1</relatesTo>, <i>eastsee@soc.yonsei.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Yong+Lee%22">Yong Lee</searchLink><relatesTo>1</relatesTo>, <i>daiginda@soc.yonsei.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Sungho+Kang%22">Sungho Kang</searchLink><relatesTo>1</relatesTo>, <i>shkang@yonsei.ac.kr</i>
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  Data: <searchLink fieldCode="JN" term="%22ETRI+Journal%22">ETRI Journal</searchLink>; Apr2014, Vol. 36 Issue 2, p293-300, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=95498058
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.4218/etrij.14.0113.0469
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 293
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      – TitleFull: A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture.
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            NameFull: Dongkwan Han
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            NameFull: Yong Lee
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            NameFull: Sungho Kang
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              Text: Apr2014
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              Y: 2014
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              Value: 36
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