Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization.

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Title: Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization.
Authors: Shafique, Muhammad1, muhammad.shafique@kit.edu, Rehman, Semeen1, semeen.rehman@student.kit.edu, Aceituno, Pau Vilimelis1, Henkel, Jörg1, henkel@kit.edu
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-9, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 96042355
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PubType: Conference
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  Data: Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization.
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  Data: <searchLink fieldCode="AU" term="%22Shafique%2C+Muhammad%22">Shafique, Muhammad</searchLink><relatesTo>1</relatesTo>, <i>muhammad.shafique@kit.edu</i><br /><searchLink fieldCode="AU" term="%22Rehman%2C+Semeen%22">Rehman, Semeen</searchLink><relatesTo>1</relatesTo>, <i>semeen.rehman@student.kit.edu</i><br /><searchLink fieldCode="AU" term="%22Aceituno%2C+Pau+Vilimelis%22">Aceituno, Pau Vilimelis</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Henkel%2C+Jörg%22">Henkel, Jörg</searchLink><relatesTo>1</relatesTo>, <i>henkel@kit.edu</i>
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RecordInfo BibRecord:
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      – Code: eng
        Text: English
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        PageCount: 9
        StartPage: 1
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      – TitleFull: Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization.
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            NameFull: Shafique, Muhammad
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            NameFull: Rehman, Semeen
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            NameFull: Aceituno, Pau Vilimelis
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            – D: 01
              M: 06
              Text: Jun2013
              Type: published
              Y: 2013
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              Value: 0738100X
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            – TitleFull: DAC: Annual ACM/IEEE Design Automation Conference
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