TEASE: A Systematic Analysis Framework for Early Evaluation of FinFET-based Advanced Technology Nodes.

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Title: TEASE: A Systematic Analysis Framework for Early Evaluation of FinFET-based Advanced Technology Nodes.
Authors: Mallik, Arindam1, Arindam.Mallik@imec.be, Zuber, Paul1, Tsung-Te Liu1, Chava, Bharani1, Ballal, Bhavana1, Del Bario, Pablo Royer1, Baert, Rogier1, Croes, Kris1, Ryckaert, Julien1, Badaroglu, Mustafa1, Mercha, Abdelkarim1, Verkest, Diederik1
Source: DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-6, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 96042363
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PubType: Conference
PubTypeId: conference
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  Data: TEASE: A Systematic Analysis Framework for Early Evaluation of FinFET-based Advanced Technology Nodes.
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      – Code: eng
        Text: English
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      – TitleFull: TEASE: A Systematic Analysis Framework for Early Evaluation of FinFET-based Advanced Technology Nodes.
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            – D: 01
              M: 06
              Text: Jun2013
              Type: published
              Y: 2013
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              Value: 0738100X
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