APA (7th ed.) Citation

Epstein, K. A., Tran, N. T., Jeffrey, F. R., & Moore, A. R. (1986). Surface photovoltage measurement of light instability of amorphous silicon films. Applied Physics Letters, 49(3), 173. https://doi.org/10.1063/1.97215

Chicago Style (17th ed.) Citation

Epstein, K. A., N. T. Tran, F. R. Jeffrey, and A. R. Moore. "Surface Photovoltage Measurement of Light Instability of Amorphous Silicon Films." Applied Physics Letters 49, no. 3 (1986): 173. https://doi.org/10.1063/1.97215.

MLA (9th ed.) Citation

Epstein, K. A., et al. "Surface Photovoltage Measurement of Light Instability of Amorphous Silicon Films." Applied Physics Letters, vol. 49, no. 3, 1986, p. 173, https://doi.org/10.1063/1.97215.