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Characterization of thin films of Y-Ba-Cu-O on oxidized silicon with a zirconia buffer layer.

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Bibliographic Details
Title: Characterization of thin films of Y-Ba-Cu-O on oxidized silicon with a zirconia buffer layer.
Authors: Mogro-Campero, A., Turner, L. G., Hall, E. L., Burrell, M. C.
Source: Applied Physics Letters; 6/13/1988, Vol. 52 Issue 24, p2068, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 9827091
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Characterization of thin films of Y-Ba-Cu-O on oxidized silicon with a zirconia buffer layer.
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  Data: <searchLink fieldCode="AU" term="%22Mogro-Campero%2C+A%2E%22">Mogro-Campero, A.</searchLink><br /><searchLink fieldCode="AU" term="%22Turner%2C+L%2E+G%2E%22">Turner, L. G.</searchLink><br /><searchLink fieldCode="AU" term="%22Hall%2C+E%2E+L%2E%22">Hall, E. L.</searchLink><br /><searchLink fieldCode="AU" term="%22Burrell%2C+M%2E+C%2E%22">Burrell, M. C.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 6/13/1988, Vol. 52 Issue 24, p2068, 3p
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      – Type: doi
        Value: 10.1063/1.99749
    Languages:
      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 2068
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      – TitleFull: Characterization of thin films of Y-Ba-Cu-O on oxidized silicon with a zirconia buffer layer.
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            NameFull: Mogro-Campero, A.
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            NameFull: Turner, L. G.
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            NameFull: Hall, E. L.
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            NameFull: Burrell, M. C.
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              Text: 6/13/1988
              Type: published
              Y: 1988
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              Value: 52
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              Value: 24
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            – TitleFull: Applied Physics Letters
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