Balberg, I., Epstein, K. A., & Ritter, D. (1989). Ambipolar diffusion length measurements in hydrogenated amorphous silicon. Applied Physics Letters, 54(24), 2461. https://doi.org/10.1063/1.101072
Chicago Style (17th ed.) CitationBalberg, I., K. A. Epstein, and D. Ritter. "Ambipolar Diffusion Length Measurements in Hydrogenated Amorphous Silicon." Applied Physics Letters 54, no. 24 (1989): 2461. https://doi.org/10.1063/1.101072.
MLA (9th ed.) CitationBalberg, I., et al. "Ambipolar Diffusion Length Measurements in Hydrogenated Amorphous Silicon." Applied Physics Letters, vol. 54, no. 24, 1989, p. 2461, https://doi.org/10.1063/1.101072.
Warning: These citations may not always be 100% accurate.