Ambipolar diffusion length measurements in hydrogenated amorphous silicon.

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Bibliographic Details
Title: Ambipolar diffusion length measurements in hydrogenated amorphous silicon.
Authors: Balberg, I., Epstein, K. A., Ritter, D.
Source: Applied Physics Letters; 6/12/1989, Vol. 54 Issue 24, p2461, 3p
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/1.101072